Academic Thesis

Basic information

Name Yokohira Tokumi
Belonging department
Occupation name
researchmap researcher code 1000035612
researchmap agency Okayama University of Science

Title

A Test Methodology for Interconnect Structures of LUT-based FPGAs

Bibliography Type

 

Author

MICHINISHI H.

Summary

 

Magazine(name)

Proceedings of the Fifth Asian Test Symposium

Publisher

 

Volume

pp.68-74

Number Of Pages

 

StartingPage

68

EndingPage

74

Date of Issue

1996-11

Referee

Exist

Invited

Not exist

Language

 

Thesis Type

 

ISSN

 

DOI

 

NAID

 

PMID

 

J-GLOBAL ID

 

arXiv ID

 

ORCID Put Code

 

DBLP ID