Academic Thesis

Basic information

Name Yokohira　Tokumi
Belonging department
Occupation name
researchmap researcher code 1000035612
researchmap agency Okayama University of Science

Title 

Proof that Akers'' Algorithm for Locally Exhaustive Testing Gives Minimum Test Sets of Combinational Circuits with up to Four Outputs.

					

					

						

							

								

									
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Author 

									
								

							

						

						
Hiroyuki Michinishi, Tokumi Yokohira and Takuji Okamoto

					

					

						

							

								

									
Summary 

									
								

							

						

						
 

					

					

						

							

								

									
Magazine(name) 

									
								

							

						

						
Proceedings of the Second Asian Test Symposium

					

					

						

							

								

									
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pp.14-19

					

					

						

							

								

									
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14

					

					

						

							

								

									
EndingPage 

									
								

							

						

						
19

					

					

						

							

								

									
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1993-11

					

					

						

							

								

									
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