CMOS floating gate defect detection using supply current test with DC power supply superposed by AC component
H MichinishiT YokohiraT OkamotoT KobayashiT Hondo
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS
E87D
3
551
556
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000220163000005&DestApp=WOS_CPL