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Mori, Yoshihisa; Nakano, Hiroko; Sakane, Genta; Aquilanti, Giuliana; Udono, Haruhiko; Takarabe, Kenichi
The results of the high-pressure x-ray diffraction study and the high-pressure extended x-ray absorption fine structure study for α-FeSi2 using the synchrotron radiation sources are reported. The bond lengths of Fe-Fe, Si-Si, and Fe-Si under pressure were refined by the Rietveld method and the EXAFS anal. It is interesting that the bond length of Si-Si is almost unchanged with increasing pressure. The DV-Xα MO calcn. was carried out for the crystal structure at 34.9 GPa and shows that the HOMO consists of only 3d orbital of Fe atom. |