A CMOS NOR Gate Model for Analyzing Metastable Operation
SATO YoichiroOKAMOTO TakujiSUGIYAMA Yuji
The Transactions of the Institute of Electronics, Information and Communication Engineers (DI)
電子情報通信学会
J75-D-I
10
http://ci.nii.ac.jp/naid/10006747959http://ci.nii.ac.jp/ncid/AN10071319http://id.ndl.go.jp/bib/3791075