Detection of CMOS open node defects by frequency analysis
Hiroyuki MichinishiTokumi YokohiraTakuji OkamotoToshifumi KobayashiTsutomu Hondo
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS
E90D
3
685
687
10.1093/ietisy/e90-d.3.685
https://doi.org/10.1093/ietisy/e90-d.3.685https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000245194600009&DestApp=WOS_CPL