Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs

Tokumi Yokohira
Toshimi Shimizu
Hiroyuki Michinishi
Yuuji Sugiyama
Takuji Okamoto

In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2 w test patterns, where w is the maximum number of inputs on which any output depends

Test Symposium

pp.280-285

280

285

10.1109/ATS.1994.367218

https://doi.org/10.1109/ATS.1994.367218
http://ci.nii.ac.jp/naid/120002305003
http://eprints.lib.okayama-u.ac.jp/30057