Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs

Yokohira Tokumi
Shimizu Toshimi
Michinishi Hiroyuki
Sugiyama Yuji
Okamoto Takuji

In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2 w test patterns, where w is the maximum number of inputs on which any output depends

Proc. Third Asian Test Symposium (ATS ''94)

pp.280-285

280

285

10.1109/ATS.1994.367218

https://doi.org/10.1109/ATS.1994.367218
http://ci.nii.ac.jp/naid/120002305003
http://eprints.lib.okayama-u.ac.jp/30057