Academic Thesis

Basic information

Name Yokohira　Tokumi
Belonging department
Occupation name
researchmap researcher code 1000035612
researchmap agency Okayama University of Science

Title 

Improvement of detectability for CMOS floating gate defects in supply current test

					

					

						

							

								

									
Bibliography　Type 

									
								

							

						

						
 

					

					

						

							

								

									
Author 

									
								

							

						

						
H Michinishi
T Yokohira
T Okamoto
T Kobayashi
T Hondo

					

					

						

							

								

									
Summary 

									
								

							

						

						
 

					

					

						

							

								

									
Magazine(name) 

									
								

							

						

						
ATS 2003: 12TH ASIAN TEST SYMPOSIUM, PROCEEDINGS

					

					

						

							

								

									
Publisher 

									
								

							

						

						
 

					

					

						

							

								

									
Volume 

									
								

							

						

						
 

					

					

						

							

								

									
Number Of Pages 

									
								

							

						

						
 

					

					

						

							

								

									
StartingPage 

									
								

							

						

						
406

					

					

						

							

								

									
EndingPage 

									
								

							

						

						
409

					

					

						

							

								

									
Date of Issue 

									
								

							

						

						
2003

					

					

						

							

								

									
Referee 

									
								

							

						

						
Exist

					

					

						

							

								

									
Invited 

									
								

							

						

						
Not exist

					

					

						

							

								

									
Language 

									
								

							

						

						
English

					

					

						

							

								

									
Thesis　Type 

									
								

							

						

						
Research papers (proceedings of international meetings)

					

					

						

							

								

									
ISSN 

									
								

							

						

						
 

					

					

						

							

								

									
DOI 

									
								

							

						

						
10.1109/ATS.2003.1250846

					

					

						

							

								

									
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PMID 

									
								

							

						

						
 

					

					
					

						

							

								

									
J-GLOBAL ID 

									
								

							

						

						
 

					

					

						

							

								

									
arXiv ID 

									
								

							

						

						
 

					

					

						

							

								

									
ORCID Put Code 

									
								

							

						

						
 

					

					

						

							

								

									
DBLP ID