Academic Thesis

Basic information

Name Sato　Ryoichi
Belonging department
Occupation name
researchmap researcher code R000072745
researchmap agency Okayama University of Science

Title 

Verify the Relationship Between Randomness and D-FF Synchronous Circuit Size in RO-based RNG

					

					

						

							

								

									
Bibliography　Type 

									
								

							

						

						
 

					

					

						

							

								

									
Author 

									
								

							

						

						
R. Sato
M. Fujiwara
Y. Nogami
Y. Kodera

					

					

						

							

								

									
Summary 

									
								

							

						

						
 

					

					

						

							

								

									
Magazine(name) 

									
								

							

						

						
2024 Asian Hardware Oriented Security and Trust Symposium Ph.D forum

					

					

						

							

								

									
Publisher 

									
								

							

						

						
 

					

					

						

							

								

									
Volume 

									
								

							

						

						
 

					

					

						

							

								

									
Number Of Pages 

									
								

							

						

						
 

					

					

						

							

								

									
StartingPage 

									
								

							

						

						
 

					

					

						

							

								

									
EndingPage 

									
								

							

						

						
 

					

					

						

							

								

									
Date of Issue 

									
								

							

						

						
2024-12

					

					

						

							

								

									
Referee 

									
								

							

						

						
Exist

					

					

						

							

								

									
Invited 

									
								

							

						

						
 

					

					

						

							

								

									
Language 

									
								

							

						

						
English

					

					

						

							

								

									
Thesis　Type 

									
								

							

						

						
Research papers (research meetings, symposium materials and others)

					

					

						

							

								

									
ISSN 

									
								

							

						

						
 

					

					

						

							

								

									
DOI 

									
								

							

						

						
 

					

					

						

							

								

									
NAID 

									
								

							

						

						
 

					

					

						

							

								

									
PMID 

									
								

							

						

						
 

					

					

						

							

								

									
URL 

									
								

							

						

						

					

					

						

							

								

									
J-GLOBAL ID 

									
								

							

						

						
 

					

					

						

							

								

									
arXiv ID 

									
								

							

						

						
 

					

					

						

							

								

									
ORCID Put Code 

									
								

							

						

						
 

					

					

						

							

								

									
DBLP ID