Conference

Basic information

Name Michinishi Hiroyuki
Belonging department
Occupation name
researchmap researcher code 1000186932
researchmap agency Okayama University of Science

Title 

Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test

					

					

						

							

								

									
Author 

									
								

							

						

						
H.Michinishi, T.Yokohira, T.Okamoto, T.Kobayashi, T.Hondo

					

					

						

							

								

									
Journal 

									
								

							

						

						
IEEE Asian Test Symposium

					

					

						

							

								

									
Publication Date 

									
								

							

						

						
2003/11

					

					

						

							

								

									
Invited 

									
								

							

						

						

					

					

						

							

								

									
Language 

									
								

							

						

						
English

					

					

						

							

								

									
  

									
								

							

						

						

					

					

						

							

								

									
Conference Class 

									
								

							

						

						

					

					

						

							

								

									
Conference Type 

									
								

							

						

						
Verbal presentations (general)

					

					

						

							

								

									
Promoter 

									
								

							

						

						

					

					

						

							

								

									
Venue 

									
								

							

						

						
西安

					

					

						

							

								

									
URL 

									
								

							

						

						

					

					

						

							

								

									
Summary