Academic Thesis

Basic information

Name Michinishi Hiroyuki
Belonging department
Occupation name
researchmap researcher code 1000186932
researchmap agency Okayama University of Science

Title 

Detection of CMOS Open Node Defects by Frequency Analysis

					

					

						

							

								

									
Bibliography　Type 

									
								

							

						

						

					

					

						

							

								

									
Author 

									
								

							

						

						
H.Michinishi, T.Yokohira, T.Okamoto, T.Kobayashi and T.Hondo

					

					

						

							

								

									
Summary 

									
								

							

						

						





					

					

						

							

								

									
Magazine(name) 

									
								

							

						

						
IEICE Trans. on Information and Systems

					

					

						

							

								

									
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Volume 

									
								

							

						

						
E90-D

					

					

						

							

								

									
Number Of Pages 

									
								

							

						

						
3

					

					

						

							

								

									
StartingPage 

									
								

							

						

						
685

					

					

						

							

								

									
EndingPage 

									
								

							

						

						
687

					

					

						

							

								

									
Date of Issue 

									
								

							

						

						
2007/03

					

					

						

							

								

									
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Invited 

									
								

							

						

						
Not exist

					

					

						

							

								

									
Language 

									
								

							

						

						
English

					

					

						

							

								

									
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Research papers (academic journals)

					

					

						

							

								

									
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