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To shed light on the correlation between the Hall coefficient (RH) and electrical resistivity(ρ), we performed simultaneous measurements of these two transport coefficients in fcc dihydride phase of yttrium(YHx), having H/Y values ranging from 1.73 to 2.04. Unlike the typical behavior of metals, an approximately linear relationship was observed between RH and ρ at room temperature after dihydrogenation of yttrium. Interpretation of this relationship, based on the Boltzmann–Bloch scheme, reveals that the transverse (cyclotron) relaxation rate (1/τc) of the carriers is relatively insensitive to the generation of hydrogen defects in the dihydride phase of yttrium, unlike the longitudinal relaxation rate (1/τ), which is affected by the presence of hydrogen defect. Low-temperature (77 K) measurements of RH and ρ on the same samples show that the approximately linear relationship observed at room temperature disappears but a certain nonlinear relationship may exist at 77 K.
Appearance of a correlation between the Hall coefficient and resistivity upon dihydrogenation of yttrium
Research papers (academic journals)
