Deep Learning based Cephalometric Landmark Identification using Landmark-dependent Multi-scale Patches.

Chonho Lee
Chihiro Tanikawa
Jae-Yeon Lim
Takashi Yamashiro

CoRR

abs/1906.02961

https://dblp.uni-trier.de/rec/journals/corr/abs-1906-02961
http://arxiv.org/abs/1906.02961
https://dblp.uni-trier.de/db/journals/corr/corr1906.html#abs-1906-02961